Spectroscopy Facility

Fluorescence, UV-vis Absorption, Ellipsometry

Participants: F. Adamietz , C. Belin, G. LeBourdon, V. Rodriguez

Spectrofluorometers :

Contact : C. Belin, G. Le Bourdon.


The two fluorometers are equipped with Right Angle and Front Face configurations. Different accessories are available to run a wide variety of samples: thermostated cuvette-holder, solid-sample holder…


Fluorolog-2 (SPEX, Modèle 212):

Source : 450W xenon lamp
Excitation monochromator : double-grating unit (1200 gr/mm gratings blazed at 250nm)
Emission monochromator : double-grating unit (1200 gr/mm gratings blazed at 500nm)
Detector: photomultiplier tube that covers the full range from UV to near-IR.

Options: Cryogenic measurements (liquid-nitrogen dewar)
Phosphorimetry (xenon flashlamp)
Polarization experiments


Fluorolog-3 (HORIBA):

Source : 450W xenon lamp
Excitation monochromator : double-grating unit (1200 gr/mm gratings blazed at 330nm)
Imaging spectrograph (150, 1200 and 1800 gr/m blazed at 500nm)
Detector: CCD and photomultiplier

Options: Temperature controlled and cryogenic measurements (liquid-nitrogen dewar)
Polarization experiments

 

 

Uv-visible Absorption:
Contact : F. Adamietz .
Lambda 650
We use the LAMBDA 650 spectrophotometer from PerkinElmer.
It is a UV/Vis system for high performance measurements between 190 nm and 900 nm for solid and liquid samples.
Absolute reflectance measurements can be performed with the Universal Reflectance Accessory (URA) from 8° to 68° angle of incidence.
We can drive the polarization of the incident beam for transmission and reflection measurements.

 

 

Refractive index measurements:
Contact : F. Adamietz .

A versatile setup has been developed to measure the refractive index of any samples such as bulk, thin or thick layers on substrate.
For bulk samples, we use the Brewster setup to measure the intensity of a P polarized laser beam after reflection on the sample for any incidence angle.
Then we fit the reflection curve with a theoretical model to extract the refractive index value.
We use several laser sources at different wavelengths to measure the refractive index dispersion from UV to Near-IR.
To measure the refractive index and the thickness of a layer we used the M-lines Setup.
We put a prism on the sample and we measure the intensity of the internal reflection. For some angles of incidence, we create coupling waves between prism and sample, so we have losses in the reflection curve. These losses are called M-Lines. We extract the refractive index and the thickness value by fitting these M-lines with a theoretical model.


Tous droits reserves, Laboratoire ISM, Universite de Bordeaux.